CALL FOR ABSTRACT - IEEE METROIND 4.0 & IOT 2022

Workshop
06/07/2022 to 06/09/2022
Save the date - IEEE International Workshop on Metrology for Industry 4.0 and IoT

From 7 to 9 June 2022, the IEEE International Workshop on Metrology for Industry 4.0 and IoT will be held in Trento.

MetroInd4.0&IoT represents an international meeting place in the world of research in the field of Metrology for Industry 4.0 and Internet of Things

National and International institutions and academia will come together to propose joint approaches by experts (engineers and professionals) of measurement instrumentation and industrial testing, and by experts (academics) in innovation metrology.

This 5th Edition will keep pursuing the state of the art and practice started over the past years. Attention is paid, but not limited to, new technology for metrology-assisted production in Industry 4.0 and IoT, Industry 4.0 and IoT component measurement, sensors and associated signal conditioning for Industry 4.0 and IoT, and calibration methods for electronic test and measurement for Industry 4.0 and IoT.

Workshop topics
  • Industrial sensors;
  • Virtual sensors, sensor interfacing;
  • IoT enabled sensors and measurement systems;
  • Measurement applications based on IoT;
  • Industrial IoT and Factory of Things;
  • Wireless sensor networks and IoT;
  • Wearables and Body Sensor Networks;
  • Sensors Data Management;
  • Localization Technologies.

Numerous Special Sessions will be organized with the main aim of creating a mini-workshop on a specific topic, where researchers working on the same argument can make knowledge, familiarize, exchange ideas, create cooperation.

These include two sessions, organized in collaboration with some INRiM colleagues.

SPECIAL SESSION #9

Large Scale Traceability Of Low-Cost Sensor Networks: Statistical Methods And In-Line Calibration Systems
The goal of the Special Session is to present large-scale calibration methods for low-cost analogue and digital sensors, based on statistical approaches, sampling methods or through calibration systems on the production line.

SPECIAL SESSION #10

Metrological Characterization And Traceability Of Digital Mems Sensors And Sensor Network: Statistical Methods And Technical Procedures 

The objective of the Special Session is to illustrate methods for the metrological characterization of digital MEMS sensors, for the metrological treatment of sensor network as a whole, remote self-calibration, data fusion in network systems and the overall uncertainty budget management.

Accepted papers will be submitted for inclusion into IEEE Xplore.

To participate at the IEEE International Workshop on Metrology for Industry 4.0 and IoT, the following dates should be noted:

  • January 23, 2022 - Extended Abstract Submission Deadline(3-4 pages);
  • April 30, 2022 - Final Paper Submission Deadline (5-6 pages).

 

For more information, please contact:

Last modified: 12/31/2021 - 13:30